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Temperature Compensated Determination of Copper Thickness

Temperature Compensated Determination of Copper Thickness

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Temperature Compensated Determination of Copper Thickness
CMI165Temperature Compensated Determination of Copper Thickness
Oxford Instruments CMI165 provides Cu thickness measurements with temperature compensation in an ergonomic
handheld device. This small, versatile, singlehanded gauge, equipped with carry case for portability, has a rugged,
durable design that allows it to be taken into the harshest environments. Automatic temperature compensation allows
for inprocess inspection and provides accurate results regardless of Cu temperature. Cu thickness is measured using
the 4point probe microresistance method.
(1) Measure hot or cold copper on PCB
(2)Reduce waste by avoiding the use of separate measurement coupons
(3)Measure foil or laminated copper thickness in mils, µm or copper weight (oz)
(4)Sort copper by weight at incoming inspection, before drilling, shearing or plating
(5) Accurately quantify copper thickness after etching or planarizing
(6) Verify copper plating thickness on PCB surface
3.Technical Parameter



Measuring Range

Non-Plating Copper

Plating Copper

(0.25-12.7) µm, (0.01-0.5) mils

(2.0-254) µm,(0.1-10) mils

Width rang

8mil/200um to 3000mil/76,200um


±5% About percent 5 (compared with calibration)


Instrument can store 9690 test results (detection equipment showed statistical data

For detailed access to all stored data, the need to connect a computer through

software to obtain thesame time, detection time can be self-set)


µm ,mils, oz


Battery powered, long battery life (measured 150 times per day, the month -long lifespan), do not use auto power off


Calibrated using a standard film

External Interface

USB2.0 Connected to the computer USB2.0

Statistical functions

Data records, mean, standard deviation and upper and lower limits to remind


SRP-T1 probe automatic measurement

Includes CMI165 Gauge, Protective Case, Spare SRP-T1 Probe Tip, 1/2 oz Surface Cu Standard

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